Analysis related products

For compatibility evaluation (SAR evaluation) for radio wave protection guidelines for mobile phones, smartphones, etc., and evaluation and development of radiation characteristics of transmitting and receiving antennas used near the human body.

Ideal for length and angle calibration of scanning probe microscopes, which are indispensable for fine pattern evaluation.

We provide nanoscale and nanobeam forming devices for measuring the beam size of electron beams and X-rays.

It is a multilayer film standard sample used for depth direction resolution evaluation, distance measurement, and sensitivity evaluation such as SIMS, AES, XPS, and XRF analysis. We will provide a standard sample of your desired material combination, film thickness, and number of layers.

This is a production service for highly sensitive microelectrodes for electrochemical measurements. You can create microelectrodes with your desired structure using your desired materials. We also accept custom made items.

Spatial resolution has been improved by one digit compared to conventional probes, making it possible to measure electrical resistance in the sub-millimeter range. Enables resistance measurement of thin film materials without patterning.