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2015 - 2016
2017 - 2018
| 論文 | 作者 | 刊登雜誌 | 產品 |
|---|---|---|---|
| O. Sekizawa, T. Uruga, N. Ishiguro, H. Matsui, K. Higashi, T. Sakata, Y. Iwasawa and M. Tada | J. Phys. Conf. Ser. | X線圖 | |
| Fresnel zone plate with apodized aperture for hard X-ray Gaussian beam optics | A. Takeuchi, K. Uesugi, Y. Suzuki, S. Itabashi and M. Oda | J. Synchrotron Rad. | X線圖 |
| In situ hard X-ray transmission microscopy for material science | K. V. Falch, D. Casari, M. Di Michiel, C. Detlefs, A. Snigireva, I. Snigireva, V. Honkimäki and R. H. Mathiesen | J. Mater. Sci. | X線圖 |
| Beamstop-based low-background ptychography to image weakly scattering objects | J. Reinhardt, R. Hoppe, G. Hofmann, C. D. Damsgaard, J. Patommel, C. Baumbach, S. Baier, A. Rochet, J. -D. Grunwaldt, G. Falkenberg and C. G. Schroer | Ultramicroscopy | X線圖 |
| High-dynamic-range water window ptychography | M. Rose, D. Dzhigaev, T. Senkbeil, A. R. von Gundlach, S. Stuhr, C. Rumancev, I. Besedin, P. Skopintsev, J. Viefhaus, A. Rosenhahn and I. A. Vartanyants | J. Phys. Conf. Ser. | X線圖 |
| 50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors | S. Matsuyama, S. Yasuda, J. Yamada, H. Okada, Y. Kohmura, M. Yabashi, T. Ishikawa and K. Yamauchi | Sci. Rep. | X線圖 |
| Probe reconstruction for holographic X-ray imaging | J. Hagemann, A. -L. Robisch, M. Osterhoff and T. Salditt | J. Synchrotron Rad. | X線圖 |
| Super-resolution x-ray imaging using interaction between periodic structure of object and standing wave generated with total-reflection-mirror interferometer | Y. Suzuki | J. Phys. Conf. Ser. | X線圖 |
| Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses | J. Patommel, S. Klare, R. Hoppe, S. Ritter, D. Samberg, F. Wittwer, A. Jahn, K. Richter, C. Wenzel, J. W. Bartha, M. Scholz, F. Seiboth, U. Boesenberg, G. Falkenberg and C. G. Schroer | Appl. Phys. Lett | X線圖 |
| Point focusing with flat and wedged crossed multilayer Laue lenses | A. Kubec, K. Melzer, J. Gluch, S. Niese, S. Braun, J. Patommel, M. Burghammer and A. Leson | J. Synchrotron Rad. | X線圖 |
| Generation of apodized X-ray illumination and its application to scanning and diffraction microscopy | K. P. Khakurel, T. Kimura, H. Nakamori, T. Goto, S. Matsuyama, T. Sasaki, M. Takei, Y. Kohmura, T. Ishikawa, K. Yamauchi and Y. Nishino | J. Synchrotron Rad. | X線圖 |
| Ellipsoidal mirror for two-dimensional 100-nm focusing in hard X-ray region | H. Yumoto, T. Koyama, S. Matsuyama, Y. Kohmura, K. Yamauchi, T. Ishikawa and H. Ohashi | Sci. Rep. | X線圖 |
| Fast full-field micro-tomography at the Nanoscopium multitechnique nanoprobe beamline of Synchrotron Soleil | K. Medjoubi , G. Baranton and A. Somogyi | Microsc. Microanal. | X線圖 |
| Ptychography with a virtually enlarged illumination | F. Wittwer, R. Hoppe, F. Seiboth, J. Reinhardt, M. Scholz and C. G. Schroer | Microsc. Microanal. | X線圖 |
| High-resolution full-field x-ray microscope for 20-keV x-rays with multilayer imaging mirrors | S. Matsuyama, J. Yamada, K. Hata, Y. Kohmura, M. Yabashi, T. Ishikawa and K. Yamauchi | Microsc. Microanal. | X線圖 |
| Toward hard X-ray transmission microscopy at the ANATOMIX Beamline of Synchrotron SOLEIL | M. Scheel, J. Perrin, F. Koch, V. Yurgens, V. L. Roux, J. -L. Giorgetta, K. Desjardins, C. Menneglier, S. Zhang, C. Engblom, Y. -M. Abiven, G. Cauchon, C. Bourgoin, A. Lestrade, T. Moreno, F. Polack, C. David and T. Weitkamp | Microsc. Microanal. | X線圖 |
| Laboratory-size x-ray microscope using Wolter mirror optics and an electron-impact X-ray source for multi-energy observation | A. Ohba, T. Nakano, S. Onoda, T. Mochizuki, K. Nakamoto, H. Hotaka, K. Fujita, S. Ohsuka, M. Miyoshi, K. Soda and T. Hamakubo | Microsc. Microanal. | X線圖 |
| 3D full-field transmission x-ray microscopy based on equally sloped tomography at Shanghai Synchrotron Radiation Facility | Y. Ren, Y. Wang, G. Zhou, G. Du, B. Deng, H. Xie and T. Xiao | Microsc. Microanal. | X線圖 |
| Sub 25 nm focusing with a long working distance using multilayer Laue lenses | A. Kubec, S. Niese, M. Rosenthal, J. Gluch, M. Burghammer, P. Gawlitza, J. Keckes and A. Leson | J. Instrum. | X線圖 |
| Design of indirect X-ray detectors for tomography on the Anatomix Beamline | K. Desjardins, M. Scheel, J. L. Giorgetta, T. Weitkamp, C. Menneglier and A. Carcy | Proc. MEDSI | X線圖 |
| Evaluation of high energy density plasma in counter-facing plasma focus device driven by laser-triggered pulse power system | T. Sodekoda, H. Kuwabara, S. Kittaka and K. Horioka | Electron. Commun. Jpn. | EUV過濾器 |
| High-space resolution imaging plate analysis of extreme ultraviolet (EUV) light from tin laser-produced plasmas | C. S. A. Musgrave, T. Murakami, T. Ugomori, K. Yoshida, S. Fujioka, H. Nishimura, H. Atarashi, T. Iyoda and K. Nagai | Rev. Sci. Instrum. | X線圖 |
| Resonant magneto-optical Kerr effect measurement system with polarization analysis using a high harmonic generation laser | Sh. Yamamoto, D. Oumbarek, M. Fujisawa, T. Someya, Y. Takahashi, T. Yamamoto, N. Ishii, K. Yaji, S. Yamamoto, T. Kanai, K. Okazaki, M. Kotsugi, J. Itatani, S. Shin and I. Matsuda | J. Electron Spectros. Relat. Phenomena | EUV鏡/軟X線鏡 |
| EUV laser irradiation system with intensity monitor | M. Ishino, T.-H. Dinh, N. Hasegawa, K. Sakaue, T. Higashiguchi, S. Ichimaru, M. Hatayama, M. Washio, M. Nishikino and T. Kawachi | Proc. Int. Conf. X-Ray Lasers | EUV鏡/軟X線鏡 |
| Hard X-ray multilayer zone plate with 25-nm outermost zone width | H. Takano, K. Sumida, H. Hirotomo, T. Koyama, S. Ichimaru, T. Ohchi, H. Takenaka and Y. Kagoshima | J. Phys. Conf. Ser. | EUV鏡/軟X線鏡 |
| Development of a high-speed vacuum ultraviolet (VUV) imaging system for the Experimental Advanced Superconducting Tokamak | F. Zhou, T. Ming, Y. Wang, Z. Wang, F. Long, Q. Zhuang, G. Li , Y. Liang and X. Gao | Rev. Sci. Instrum. | EUV鏡/軟X線鏡 |
| Nondestructive multiscale x-ray tomography by combining microtomography and high-energy phase-contrast nanotomography | A. Takeuchi, K. Uesugi, M. Uesugi, F. Yoshinaka and T. Nakamura | Microsc. Microanal. | X射線菲涅爾區板 |
| 3D observation of quasicrystal alloy using x-ray differential phase-contrast microscope with a zone plate | N. Watanabe and S. Aoki | Microsc. Microanal. | X射線菲涅爾區板 |
| Observation of morphology changes of fine eutectic Si phase in Al-10%Si cast alloy during heat treatment by synchrotron radiation nanotomography | S. Furuta, M. Kobayashi, K. Uesugi, A. Takeuchi, T. Aoba and H. Miura | Materials | X射線菲涅爾區板 |
| Difference in preferential orientations of crystal planes and crystal sizes along the radial direction of poly-p-phenylenebenzobisoxazole (PBO) fibers | T. Kitagawa | J. Fiber Sci. Technol. | X射線菲涅爾區板 |
| Improvement of quantitative performance of imaging x-ray microscope by reduction of edge-enhancement effect | A. Takeuchi, K. Uesugi and Y. Suzuki | J. Phys. Conf. Ser. | X射線菲涅爾區板 |
| Introducing high efficiency image detector to X-ray imaging tomography | K. Uesugi, M. Hoshino and A. Takeuchi | J. Phys. Conf. Ser. | X射線菲涅爾區板 |
| Dependence of fiber-structural formation processes for rigid-rod polymers on the miscibility of their molecular chains in poly-phosphoric acid | N. Taniguchi, Y. Abe, Y. Mitooka and T. Kitagawa |
Eur. Polym. J.
|
X射線菲涅爾區板 |
| Reliable absorbance measurement of liquid samples in soft X-ray absorption spectroscopy in transmission mode | M. Nagasaka, H. Yuzawa, T. Horigome and N. Kosugi | J. Electron Spectros. Relat. Phenomena | SiC膜/SiN膜/ X射線過濾容器 |
| Effect of amino group protonation on the carboxyl group in aqueous glycine observed by O 1s X-ray emission spectroscopy | Y. Horikawa, T. Tokushima, Takahashi Y. Harada, A. Hirayae and S. Shinc | Phys. Chem. Chem. Phys. | SiC膜/SiN膜/ X射線過濾容器 |
| Force detection of high-frequency electron paramagnetic resonance spectroscopy of microliter solution sample | T. Okamoto, H. Takahashi, E. Ohmichi, H. Ishikawa, Y. Mizutani and H. Ohta | Appl. Phys. Lett. | SiC膜/SiN膜/ X射線過濾容器 |
| Equally sloped tomography based X-ray full-field nano-CT at Shanghai Synchrotron Radiation Facility | Y. Wang, Y. Rena, G. Zhou, G. Du, H. Xie, B. Deng and T. Xiao | Nucl. Instrum. Methods. Phys. Res. A | SiC膜/SiN膜/ X射線過濾容器 |
| Force-detected high-frequency electron spin resonance spectroscopy using magnet-mounted nanomembrane: Robust detection of thermal magnetization modulation | H. Takahashi, T. Okamoto, K. Ishimura, S. Hara, E. Ohmichi and H. Ohta | Rev. Sci. Instrum. | SiC膜/SiN膜/ X射線過濾容器 |
| Enhancement of the hydrogen-bonding network of water confined in a polyelectrolyte brush | K. Yamazoe, Y. Higaki, Y. Inutsuka, J. Miyawaki, Y. -T. Cui, A. Takahara and Y. Harada | Langmuir | SiC膜/SiN膜/ X射線過濾容器 |
| Interaction between water and alkali metal Ions and its temperature dependence revealed by oxygen K-edge x-ray absorption spectroscopy | M. Nagasaka, H. Yuzawa and N. Kosugi | J. Phys. Chem. B | SiC膜/SiN膜/ X射線過濾容器 |
| Unusual water hydrogen bond network around hydrogenated nanodiamonds | T. Petit, L. Puskar, T. Dolenko, S. Choudhury, E. Ritter, S. Burikov, K. Laptinskiy, Q. Brzustowski, U. Schade, H. Yuzawa, M. Nagasaka, N. Kosugi, M. Kurzyp, A. Venerosy, H. Girard, J. -C. Arnault, E. Osawa, N. Nunn, O. Shenderova and E. F. Aziz | J. Phys. Chem. C | SiC膜/SiN膜/ X射線過濾容器 |
| Electrochemically grown ZnO vertical nanowire scintillator with light-guiding effect | M. Izaki, M. Kobayashi, T. Shinagawa, T. Koyama, K. Uesugi and A. Takeuchi | Phys. Status Solidi A | SiC膜/SiN膜/ X射線過濾容器 |
| Development of a spectro-electrochemical cell for soft X-ray photon-in photon-out spectroscopy | T. Ishihara, T. Tokushima, Y. Horikawa, M. Kato and I. Yagi | Rev. Sci. Instrum. | SiC膜/SiN膜/ X射線過濾容器 |
| Altervalent substitution of sodium for calcium in biogenic calcite and aragonite | T. Yoshimura, Y. Tamenori, A. Suzuki, H. Kawahata, N. Iwasaki, H. Hasegawa, L. T. Nguyen, A. Kuroyanagi, T. Yamazaki, J. Kuroda and N. Ohkouchi | Geochim. Cosmochim. Acta | SiC膜/SiN膜/ X射線過濾容器 |
| Generation of sub-two-cycle millijoule infrared pulses in an optical parametric chirped-pulse amplifier and their application to soft x-ray absorption spectroscopy with high-flux high harmoni | N. Ishii, K. Kaneshima, T. Kanai, S. Watanabe and J. Itatani | J. Opt. | SiC膜/SiN膜/ X射線過濾容器 |
| Probing the OH stretch in different local environments in liquid water | Y. Harada, J. Miyawaki, H. Niwa, K. Yamazoe, L. G. M. Pettersso and A. Nilsson | J. Phys. Chem. Lett. | SiC膜/SiN膜/ X射線過濾容器 |
| A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy | D. Grötzsch, C. Streeck, C. Nietzold, W. Malzer, I. Mantouvalou, A. Nutsch, P. Dietrich, W. Unger, B. Beckhoff and B. Kanngießer | Rev. Sci. Instrum. | SiC膜/SiN膜/ X射線過濾容器 |
| Development of compound refractive lenses made of quartz glass designed for microdiffraction system at BL13XU in SPring-8 | K. Sumitani, Y. Imai and S. Kimura | J. Instrum. | X射線折射透鏡 |
| Compound refractive lens optics for microbeam X-ray diffraction measurements at BL13XU in SPring-8 | K. Sumitani, Y. Imai and S. Kimura | Microsc. Microanal. | X射線折射透鏡 |
| Improvement of scanning procedure for 4D-X-ray phase tomography | M. Hoshino, K. Uesugi, N. Yagi and T. Tsukube | Microsc. Microanal. | X-ray Grating |
| Systematic-error-free wavefront measurement using an X-ray single-grating interferometer | T. Inoue, S. Matsuyama, S. Kawai, H. Yumoto, Y. Inubushi, T. Osaka, I. Inoue, T. Koyama, K. Tono, H. Ohashi, M. Yabashi, T. Ishikawa and K. Yamauchi | Rev. Sci. Instrum. | X-ray Grating |
| Nanofocusing of X-ray free-electron laser using wavefront-corrected multilayer focusing mirrors | S. Matsuyama, T. Inoue, J. Yamada, J. Kim, H. Yumoto, Y. Inubushi, T. Osaka, I. Inoue, T. Koyama, K. Tono, H. Ohashi, M. Yabashi, T. Ishikawa and K. Yamauchi | Sci. Rep. | X-ray Grating |
| Development of full-field x-ray phase-tomographic microscope based on laboratory x-ray source | H. Takano, Y. Wu and A. Momose | Proc. SPIE | X-ray Grating |
| Development of laser-based scanning µ-ARPES system with ultimate energy and momentum resolutions | H. Iwasawa, E. F. Schwiera, M. Arita, A. Ino, H. Namatame, M. Taniguchi, Y. Aiura and K. Shimada | Ultramicroscopy | UV Focusing lens |
2019 - 2020
| 論文 | 作者 | 刊登雜誌 | 產品 |
|---|---|---|---|
| S. Matsuyama, J. Yamada, Y. Kohmura, M. Yabashi, T. Ishikawa and K. Yamauchi | Opt. Express | X線圖 | |
| Wavelength-scale ptychographic coherent diffractive imaging using a high-order harmonic source | G. K. Tadesse, W. Eschen, R. Klas, M. Tschernajew, F. Tuitje, M. Steinert, M. Zilk, V. Schuster, M. Zürch, T. Pertsch, C. Spielmann, J. Limpert and J. Rothhardt | Sci. Rep. | X線圖 |
| Development of an X-ray imaging detector to resolve 200 nm line-and-space patterns by using transparent ceramics layers bonded by solid-state diffusion | T. Kameshima, A. Takeuchi, K. Uesugi, T. Kudo, Y. Kohmura, K. Tamasaku, K. Muramatsu, T. Yanagitani, M. Yabashi and T. Hatsui | Opt. Let. | X線圖 |
| Optical performance and radiation stability of polymer X-ray refractive nano-lenses | A. Barannikov, M. Polikarpov, P. Ershov, V. Bessonov, K. Abrashitova, I. Snigireva, V. Yunkin, G. Bourenkov, T. Schneider, A. A. Fedyanin and A. Snigirev | J. Synchrotron Rad. | X線圖 |
| Full-field hard X-ray microscopy based on aberration-corrected Be CRLs | A. Schropp, D. Brückner, J. Bulda, G. Falkenberg, J. Garrevoet, J. Hagemann, F. Seiboth, K. Spiers, F. Koch, C. David, M. Gambino, M. Veselý, F. Meirer and C. G. Schroer | Proc. SPIE | X線圖 |
| Visualization of protein crystals by high-energy phase-contrast X-ray imaging | M. Polikarpov, G. Bourenkov, I. Snigireva, A. Snigirev, S. Zimmermann, K. Csanko, S. Brockhauser and T. R. Schneider | Acta Cryst. D | X線圖 |
| Ptychographic characterisation of polymer compound refractive lenses manufactured by additive technology | M. Lyubomirskiy, F. Koch, K. A. Abrashitova, V. O. Bessonov, N. Kokareva, A. Petrov, F. Seiboth, F. Wittwer, M. Kahnt, M. Seyrich, A. A. Fedyanin, C. David and C. G. Schroer | Opt. Express | X線圖 |
| Nanoscale Coherent Diffractive Imaging using High-harmonic XUV Sources | G. K. Tadesse | PhD. Dissertation, Friedrich-Schiller-U. Jena | X線圖 |
| Optical performance and radiation stability of polymer X-ray refractive nano-lenses | A. Barannikov, M. Polikarpov, P. Ershov, V. Bessonov, K. Abrashitova, I. Snigireva, V. Yunkin, G. Bourenkov, T. Schneider, A. A. Fedyanin and A. Snigirev | J. Synchrotron Rad. | X線圖 |
| Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques | F. Seiboth, D. Brückner, M. Kahnt, M. Lyubomirskiy, F. Wittwer, D. Dzhigaev, T. Ullsperger, S. Nolte, F. Koch, C. David, J. Garrevoet, G. Falkenberg and C. G. Schroer | J. Synchrotron Rad. | X線圖 |
| CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV | G. Falkenberg, F. Seiboth, F. Koch, K. Falch, A. Schropp, D. Brückner and J. Garrevoet | Powder Diffr . | X線圖 |
| Recent progress in synchrotron radiation 3D–4D nano-imaging based on X-ray full-field microscopy | A. Takeuchi and Y. Suzuki | Microscopy | X線圖 |
| Compact full-field hard x-ray microscope based on advanced Kirkpatrick–Baez mirrors | J. Yamada, S. Matsuyama, R. Hirose, Y. Takeda, Y. Kohmura, M. Yabashi, K. Omote, T. Ishikawa and K. Yamauchi | Optica | X線圖 |
| PtyNAMi: ptychographic nano-analytical microscope | A. Schropp, R. Döhrmann, S. Botta, D. Brückner, M. Kahnt, M. Lyubomirskiy, C. Ossig, M. Scholz, M. Seyrich, M. E. Stuckelberger, P. Wiljes, F. Wittwer, J. Garrevoet, G. Falkenberg, Y. Fam, T. L. Sheppard, J.-D. Grunwaldt and C. G. Schroer | J. Appl. Cryst. | X線圖 |
| Soft-x-ray vortex beam detected by inline holography | Y. Ishii, K. Yamamoto, Y. Yokoyama, M. Mizumaki, H. Nakao, T. Arima and Y. Yamasaki | Phys. Rev. Appl. | X線圖 |
| Nanofabrication of 50 nm zone plates through e-beam lithography with local proximity effect correction for x-ray imaging | J. Zhu, S. Zhang, S. Xie, C. Xu, L. Zhang, X. Tao,Y. Ren, Y. Wang, B. Deng, R. Tai and Y. Chen | Chin. Phys. B | X線圖 |
| Soft x-ray laser beamline for surface processing and damage studies | M. Ishino, T. -H. Dinh, Y. Hosaka, N. Hasegawa, K. Yoshimura, H. Yamamoto, T. Hatano, T. Higashiguchi, K. Sakaue, S. Ichimaru, M. Hatayama, A. Sasaki, M. Washio, M. Nishikino and Y. Maekawa | Appl. Opt. | EUV鏡/軟X線鏡 |
| Extreme ultraviolet time- and angle-resolved photoemission setup with 21.5 meV resolution using high-order harmonic generation from a turn-key Yb:KGW amplifier | Y. Liu, J. E. Beetar, M. M. Hosen, G. Dhakal, C. Sims, F. Kabir, M. B. Etienne, K. Dimitri, S. Regmi, Y. Liu, A. K. Pathak, D. Kaczorowski, M. Neupane and M. Chini | Review of Scientific Instruments | EUV鏡/軟X線鏡 |
| Measuring the topological charge of an x-ray vortex using a triangular aperture | Y. Taira and Y. Kohmura | J. Opt. | X射線菲涅爾區板 |
| Current status of nanobeam x-ray diffraction station at SPring-8 | Y. Imai, K. Sumitani and S. Kimura | AIP Conf. Proc. | X射線菲涅爾區板 |
| Soft X-ray absorption spectroscopy in the low-energy region explored using an argon gas window | M. Nagasaka | J. Synchrotron Rad. | SiC膜/SiN膜/ X射線過濾容器 |
| Enhancement of temperature change induced by anomalous Ettingshausen effect in thin Ni films on suspended membrane substrates | R. Modak and K. Uchida | Appl. Phys. Lett. | SiC膜/SiN膜/ X射線過濾容器 |
| Operando observations of a manganese oxide electrocatalyst for water oxidation using hard/tender/soft X-ray absorption spectroscopy | S. Tsunekawa, F. Yamamoto, K. -H. Wang, M. Nagasaka, H. Yuzawa, S. Takakusagi, H. Kondoh, K. Asakura, T. Kawai and M. Yoshida | J. Phys. Chem. C | SiC膜/SiN膜/ X射線過濾容器 |
| Generation of an X-ray nanobeam of a free-electron laser using reflective optics with speckle interferometry | T. Inoue, S. Matsuyama, J. Yamada, N. Nakamura, T. Osaka, I. Inoue, Y. Inubushi, K. Tono, H. Yumoto, T. Koyama, H. Ohashi, M. Yabashi, T. Ishikawa and K. Yamauchi | J. Synchrotron Rad. | SiC膜/SiN膜/ X射線過濾容器 |
| Photoelectron based soft x-ray detector for removing high order x rays | M. Nagasaka and H. Iwayama | Rev. Sci. Instrum. | SiC膜/SiN膜/ X射線過濾容器 |
| Utilizing ion leaching effects for achieving high oxygen-evolving performance on hybrid nanocomposite with self-optimized behaviors |
D. Guan, G. Ryu, Z. Hu, J. Zhou, C. -L. Dong, Y. -C. Huang, K. Zhang, Y. Zhong, A. C. Komarek, M. Zhu, X. Wu, C. -W. Pao,
C. -K. Chang, H. -J. Lin, C. -T. Chen, W. Zhou and Z. Shao
|
Nat. Commun. | SiC膜/SiN膜/ X射線過濾容器 |
| Electronic states of acetic acid in a binary mixture of acetic acid and 1-methylimidazole depend on the environment | N. Yoshimura, O. Takahashi, M. Oura and Y. Horikawa | J. Phys. Chem. B | SiC膜/SiN膜/ X射線過濾容器 |
| Elucidation of structure–activity correlations in a nickel manganese oxide oxygen evolution reaction catalyst by operando Ni L-edge X-ray absorption spectroscopy and 2p3d resonant inelastic X-ray scattering | M. Al Samarai, A. W. Hahn, A. B. Askari, Y. -T. Cui, K. Yamazoe, J. Miyawaki, Y. Harada, O. Rüdiger and S. DeBeer | ACS Appl. Mater. Interfaces | SiC膜/SiN膜/ X射線過濾容器 |
| Measurements of ultrafast dissociation in resonant inelastic x-ray scattering of water | K. Yamazoe, J. Miyawaki, H. Niwa, A. Nilsson and Y. Harada | J. Chem. Phys. | SiC膜/SiN膜/ X射線過濾容器 |
| X-ray single-grating interferometry for wavefront measurement and correction of hard X-ray nanofocusing mirrors | J. Yamada, T. Inoue, N. Nakamura, T. Kameshima, K. Yamauchi, S. Matsuyama and M. Yabashi | Sensors | X-ray Grating |
| Compact reflective imaging optics in hard X-ray region based on concave and convex mirrors | J. Yamada, S. Matsuyama, Y. Sano, Y. Kohmura, M. Yabashi, T. Ishikawa and K. Yamauchi | Opt. Express | X-ray Grating |
2021 - 2022
| 論文 | 作者 | 刊登雜誌 | 產品 |
|---|---|---|---|
| A. Takeuchi, K. Uesugi, M. Uesugi, H. Toda, K. Hirayama, K. Shimizu, K. Matsuo and T. Nakamura | Rev. Sci. Instrum | X線圖 | |
| Hard X-ray nanoprobe scanner | A. Takeuchi, K. Uesugi, Y. Suzuki, S. Itabashi and M. Oda | J. Synchrotron Rad. | X線圖 |
| Ultra-low density, nanostructured free-standing films for EUV Pellicles | M. D. Lima, T. Ueda, L. Plata, Y. Yang, V. Le, N. Keller, C. Huynh, T. Harada and T. Kondo | Proc. SPIE | EUV/X射線光學係統設計與制作 |
| Analytical System for Simultaneous Operando Measurements of Electrochemical Reaction Rate and Hard X-ray Photoemission Spectroscopy | K. Suda, T. Kawamoto, S. Yasuno, T. Watanabe, T. Koganezawa, M. Matsumoto, H. Imai, I. Hirosawa and J. Inukai | J.Electrochem. Soc. | SiC膜/SiN膜/ X射線過濾容器 |
| Laboratory-size x-ray microscope using Wolter mirror optics and an electron-impact x-ray source | A. Ohba, T. Nakano, S. Onoda, T. Mochizuki, K. Nakamoto and H. Hotaka | Rev. Sci. Instrum | X線圖 |
| Direct observation of the layer-number-dependent electronic structure in few-layer WTe2 | M. Sakano, Y. Tanaka, S. Masubuchi, S. Okazaki, T. Nomoto, A. Oshima, K. Watanabe, T. Taniguchi, R. Arita, T. Sasagawa, T. Machida and K. Ishizaka | arXiv | UV Focusing lens |
| X-ray laser development at the Institute of Laser Engineering, Osaka University with worldwide collaboration | Y. Kato amd H. Daido | Proc. SPIE | EUV鏡/軟X線鏡 |
| Hydration of the Zwitterionic and Protonated Forms of Glycine Betaine Probed by Soft X-ray Emission Spectroscopy Coupled with Chemometrics | S. Ohsawa, T. Tokushima and K. Okada | J. Phys. Chem. B | SiC膜/SiN膜/ X射線過濾容器 |
| Development of Operando Observation Technique of Electrochemical Reactions at the Solid-Liquid Interface by Fluorescence-yield Wavelength-dispersive Soft X-ray Absorption Spectroscopy | K. Sakata and K. Amemiya | Chem. Lett. | SiC膜/SiN膜/ X射線過濾容器 |
| Dynamic nanoimaging of extended objects via hard X-ray multiple-shot coherent diffraction with projection illumination optics | Y. Takayama, K. Fukuda, M. Kawashima, Y. Aoi, D. Shigematsu, T. Akada, T. Ikeda and Y. Kagoshima | Commun. Phys. |
X射線菲涅耳區域板 |
| NanoMAX: the hard X-ray nanoprobe beamline at the MAX IV Laboratory | U. Johansson, D. Carbone, S. Kalbfleisch, A. Björling, M. Kahnt, S. Sala, T. Stankevic, M. Liebi, A. Rodriguez Fernandez, B. Bring, D. Paterson, K. Thånell, P. Bell, D. Erb, C. Weninger, Z. Matej, L. Roslund, K. Åhnberg, B. Norsk Jensen, H. Tarawneh, A. Mikkelsen and U. Vogt | J. Synchrotron Rad. | X線圖 |
| Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view | F. Wittwer, M. Lyubomirskiy, F. Koch, M. Kahnt, M. Seyrich, J. Garrevoet, C. David and C. G. Schroer | Appl. Phys. Lett. | X線圖 |
| K. Akada, K. Yamazoe, J. Miyawaki, R. Maeda, K. Ito and Y. Harada | Front. Chem. | SiC膜/SiN膜/ X射線過濾容器 | |
| Planar refractive lenses made of SiC for high intensity nanofocusing | M. Lyubomirskiy, B. Schurink, I. A. Makhotkin, D. Brueckner, F. Wittwer, M. Kahnt, M. Seyrich, F. Seiboth, F. Bijkerk and C. G. Schroe | Opt. Express | X線圖 |
2023 - 2024
| 論文 | 作者 | 刊登雜誌 | 產品 |
|---|---|---|---|
| S. Yamaguchi, S. Kato, W. Yoshimune, D. Setoyama, A. Kato, Y. Nagai, T. Suzuki, A. Takeuchi and K. Uesugi | J.Synchrotron Rad. | X射線菲涅爾區板 | |
| Coherent XUV Multispectral Diffraction Imaging in the Microscale | S. Petrakis, A. Skoulakis, Y. Orphanos, A. Grigoriadis, G. Andrianaki, D. Louloudakis, N. Kortsalioudakis, A. Tsapras, C. Balas, D. Zouridis, E. Pachos, M. Bakarezos, V. Dimitriou, M. Tatarakis, E. P. Benis and N. A. Papadogiannis | Appl. Sci. | EUV鏡/軟X線鏡 |
| Operando resonant soft X-ray emission spectroscopy of the LiMn2O4 cathode using an aqueous electrolyte solution | D. Asakura, Y. Nanba, H. Niwa, H. Kiuchi, J. Miyawaki, M. Okubo, H. Matsuda, Y. Harada and E. Hosono | Phys. Chem. Chem. Phys. | SiC膜/SiN膜/ X射線過濾容器 |
| Development of projection X-ray microscope with 100 nm spot size | N. Matsunaga, T. Sato, K. Higuchi and A. Yamada | Nondestr.Test. Eval. | X線圖 |
| Dry pick-and-flip assembly of van der Waals heterostructures for microfocus angle-resolved photoemission spectroscopy | S. Masubuchi, M. Sakano, Y. Tanaka, Y. Wakafuji, T. Yamamoto, S. Okazaki, K. Watanabe, T. Taniguchi, J. Li, H. Ejima, T.Sasagawa, K. Ishizaka and T. Machida | Sci. Rep. | UV Focusing lens |
| Current Status of Hard X-Ray Nano-Tomography on the Transmission Microscope at the ANATOMIX Beamline | M. Scheel, J. Perrin, F. Koch, G. Daniel, J. L. Giorgetta, G. Cauchon, A. King, V. Yurgens, V. Le. Roux and C. David | J. Phys. | X線圖 |
| Development of 150 Mpixel lens-coupled X-ray imaging detectors equipped with diffusion-free transparent scintillators based on an analytical optimization approach | T. Kameshima and T. Hatsui | J. Phys. | X線圖 |
| Operando Observation of the Electrochemical Oxygen Evolution Reaction with a Co Oxide Catalyst Using Fluorescence-yield Wavelength-Dispersive Soft X-ray Absorption Spectroscopy | K. Sakata and K. Amemiya | e-J. Surf. Sci. Nanotechnol | SiC膜/SiN膜/ X射線過濾容器 |
| Photoelectron spectromicroscopy analysis of graphene during gate-controlled photo-oxidation process | N. Nagamura, S. Konno, M. Matsumoto, W. Zhang, M. Kotsugi, M. Oshima and R. Nouchi | Nano Express | X射線菲涅爾區板 |
| Phase retrieval based on a total-variation-regularized Poisson model for X-ray ptychographic imaging of low-contrast objects | K. Yatabe and Y. Takayama | J. Appl. Cryst. | X線圖 |
| Hard x-ray wavefront engineering for aberration correction and beam shaping | C. G. Schroer, F. Seiboth, A. Schropp, S. Achilles, M. Seyrich, S. Patjens, M. E. Stuckelberger, J. Garrevoet, V. Galbierz, G. Falkenberg, A. Kubec, C. David, S. Niese and P. Gawlitza | Proc. SPIE | X線圖 |
| Nanostructural polymorphism in the low-birefringence chiral phase of an achiral bent-shaped dimer | K. V. Le, M. R. Tuchband, H. Iwayama, Y. Takanishi, N. A. Clark and F. Araoka | arXiv | SiC膜/SiN膜/ X射線過濾容器 |
| Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples | M. Lyubomirskiy, F. Wittwer, M. Kahnt, F. Koch, A. Kubec, K. Falch, J. Garrevoet, M. Seyrich, C. David and C. G. Schroer | Sci. Rep. | X線圖 |
| Optimizing high harmonic generation in hollow-core gas cell considering variation of gas density | Y. S. Kim, B. Moon, C. Kim, B. -K. Ju, J. H. Lee and Y. M. Jhon | Opt. Laser Technol. | EUV鏡/軟X線鏡 |
| In situ fluorescence yield soft X-ray absorption spectroscopy of electrochemical nickel deposition processes with and without ethylene glycol | A. Yamaguchi, N. Akamatsu, S. Saegusa, R. Nakamura, Y. Utsumi, M. Kato, I. Yagi, T. Ishihara and M. Oura | RSC Adv. | SiC膜/SiN膜/ X射線過濾容器 |
| Rapid aberration correction for diffractive X-ray optics by additive manufacturing | F. Seiboth, A. Kubec, A. Schropp, S. Niese, P. Gawlitza, J. Garrevoet, V. Galbierz, S. Achilles, S. Patjens, M. E. Stuckelberger, C. David and C. G. Schroer | Opt. Express |
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